Agilent Technologies N5416A manuales

Manuales del propietario y guías del usuario para Cubos de interfaz Agilent Technologies N5416A.
Ofrecemos 1 manuales en pdf Agilent Technologies N5416A para descargar gratis por tipos de documentos: Manual de servicio


Tabla de contenidos

Agilent N5416A

1

USB 2.0 Compliance Test

1

In This Book

4

Contents

5

7 Low and Full Speed Tests

11

8 On-The-Go Electrical Tests

12

Installing the Software

16

Installing the License Key

17

Table 2 Digital Multimeter

21

Setting Up the Equipment

25

Single-Ended Connection

26

Online Help Topics

30

Running Tests

31

Device Hi-Speed Tests

33

3 Device Hi-Speed Tests

34

EL_6 Rise Time

39

EL_6 Fall Time

39

Device Packet Parameters

41

Device Hi-Speed Tests 3

45

Device CHIRP Timing

48

Device Test J/K, SE0_NAK

59

Device Receiver Sensitivity

65

Hub Hi-Speed Tests

71

Before Running These Tests

72

Hub Disconnect Detect

86

IO Libraries>IO Control

99

82357 device

99

4 Hub Hi-Speed Tests

100

Hub Hi-Speed Tests 4

101

Connecting the Equipment

102

Running the Tests

103

Test Instructions

103

Viewing Test Results

105

Equipment Used

106

Selecting the Tests

107

Configuring the Tests

107

Test Instructions, Part 1

114

Test Instructions, Part 2

115

EL_40 Resume Timing Response

123

EL_8 K Test

131

EL_9 SE0_NAK Test

132

Agilent Technologies

141

Host Hi-Speed Signal Quality

143

EL_21 Sync Field Length Test

152

EL_25 EOP Length Test

152

Host Disconnect Detect

155

Host CHIRP Timing

159

Host Suspend/Resume Timing

164

EL_41 Resume Timing Response

167

Host Test J/K, SE0_NAK

169

Low and Full Speed Tests

177

Droop/Drop Test

178

USB Power

179

Host and Self-Powered Hubs

180

Test port indicator

185

Blinking LED indicate

185

Test port

185

Bus-Powered Hubs

188

Fixture)

194

Inrush Current Test

197

Signal Integrity Test

200

Host Full Speed Test

202

Hub Downstream Low Speed Test

205

Upstream Signal Quality Test

211

Upstream Full Speed Test

216

On-The-Go Electrical Tests

227

E3 VBUS Rise Time

232

E19 A-Device Session Valid

232