Agilent Technologies 4294A Manual de usuario descargar pdf (Pagina 7)

Three multi-trace modes

for comparison evaluation

Superimpose trace (accumulate) mode

This mode is used to observe an

inter-mittent event or a change in

the characteristic performance of a

device over time.

Accumulation of resonance vs. temperature

data for a ceramic capacitor

List sweep mode

Superimpose and compare measure-

ment data on the same display by

setting the list sweep segments to the

same frequency range with different

DC bias or test signal levels. Markers

can be used on each trace.

Capacitance variations of ceramic capacitor

(2.2 μF) with high permittivity measured by

stepping the test signal level from 0.1 V to

0.9 V in 0.2 V steps (five list sweep

segments)

Data/Memory trace

A data trace and a memory trace are

available at each channel. The under-

lying data can be saved as the memory

trace. Some simple calculations are

possible with data math functions.

Inductor DC dependency characteristics

(100 µH inductor at 100 kHz) UP and DOWN

DC current bias sweep from –100 mA to

+100 mA. Hysteresis is observed.

Powerful functions for efficient evaluation

Sweep, display, and markers

Up sweep/down sweep

Control the sweep direction.

Sweep frequency, test signal

level, or DC bias from lower

to higher or higher to lower

value.

Scale Log or linear

Sweep type Log, linear or list

Trace statistics

Average, standard deviation and peak of each trace.

Manual sweep function

Iterative measurements

at a user designated

point. After measuring

the overall performance

of a device within a wide

range, you can evaluate

the characteristic at a

speciﬁ c point.

Marker functions

Peak search, next peak

search, max/min search,

bandwidth search, and

other marker

7 sub markers

Measurement and

frequency data are

displayed as sub marker

soft key labels.

Ceramic resonator

measurement

DC bias/test signal level monitor

Accurate reading of the DC bias or test signal level.

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