Agilent Technologies E5071C Manual de usuario descargar pdf (Pagina 13)

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Obtain confidence in design through complete

characterization of high-speed serial interconnects

High-speed serial interconnects

As bit rates of digital systems increase, signal integrity of

interconnects drastically affects system performance. Fast and

accurate analysis of interconnect performance in both time and

frequency domains become critical to ensure reliable system

performance.

Because managing multiple test systems becomes difficult,

a single test system that can fully characterize differential high

speed digital devices is a very powerful tool.

The Enhanced time domain analysis option provides an one

box solution for high speed interconnect analysis, enabling

time domain, frequency domain, and eye diagram analysis.

The Enhanced time domain analysis option provides the following

three breakthroughs for signal integrity design and verification:

•SimpleandIntuitiveOperation

•FastandAccurateMeasurements

•ESDRobustness

Simultaneous analysis of both time and frequency domains

The Setup Wizard guides the user

through all of the required steps.

Simulated eye diagram analysis using the virtual bit

pattern generator

Simple and Intuitive Operation

TDR oscilloscope look-and-feel.

▼ Dedicated controls for common adjustments

▼ Automatic display allocation for most common

measurement parameters

▼ The Setup Wizard guides the user through all the

required steps, making setup, error correction, and

measurement intuitive and error free

ESD Robustness

Protection circuits implemented inside the instrument.

▼ Proprietary electrostatic discharge (ESD) protection

chip to significantly increase ESD robustness, while at

the same time maintaining excellent RF performance

Fast and Accurate Measurements

Delivers new standards in speed, accuracy, and versatility.

▼ Wide dynamic range to observe the true performance of

your device

▼ Low noise floor for accurate and repeatable

measurements

▼ Fast measurement speed for real-time analysis

▼ State-of-the art calibration techniques to reduce

measurement errors

For additional information regarding the Enhanced time domain analysis

option, visit: www.agilent.com/find/ena-tdr

Time Domain Frequency Domain

Eye Diagram

1 2 ... 8 9 10 11 12 13 14 15 16 17 18

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