Agilent Technologies HFBR 5203 Manual de usuario descargar pdf (Pagina 2)

Versatile Link Transmitter

HFBR-1521, 1522, 1524, 1531, 1532

High Temperature Operating Life Test

A. Demonstrated Performance

Equivalent Device

Test Test Condition Samples Hours Failures

High Temperature T

= 85°C, I

= 150 mA, HFBR-1521 480,000 0

Operating Life 50% Duty Cycle, 1 kHz 480 units

B. Failure Criteria

Failure has occurred when the unit fails catastrophically,

or when the light output power decreases 3 dB.

Notes:

1. The

point

MTTF (representing an estimate of the mean point MTTF) is the total device hours

divided by either the number of failures or unity if there are no failures.

90% confident

MTTF and failure rate represent the minimum level of reliability performance that

is expected from 90% of all samples. This confidence interval is based on the statistics of the

distribution of failures. The assumed distribution of failures is exponential. This particular

distribution is commonly used in describing failure rates prior to the onset of wear out. Refer to

MIL-STD-690 for details of this methodology.

3. 1 FIT = 1 failure per 10

device hours.

Point Typical

[1]

90% Confident

[2]

Ambient Junction MTTF

[1]

FITs

[3]

MTTF

[2]

FITs

[3]

Temperature (°C) Temperature (°C) (hours) ( / 10

hours) (hours) ( / 10

hours)

85 100 480,000 2,100 208,000 4,800

75 90 716,000 1,400 311,000 3,200

65 80 1,090,000 910 473,000 2,100

55 70 1,710,000 580 742,000 1,300

45 60 2,760,000 360 1,200,000 840

35 50 4,600,000 220 2,000,000 500

25 40 7,910,000 130 3,430,000 290

C. Failure Rate Prediction for Random Failures ( I

@ 150 mA, 50% duty cycle )

1 2 3 4

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