Agilent Technologies Ininiium 90000 Especificaciones descargar pdf (Pagina 34)

Infiniium DSO-X 90000A Series Oscilloscopes

Performance characteristics

Maximum measurement update

rate

> 50,000 measurement/sec (one measurement turned on)

> 250,000 measurement/sec/measurement (ten measurements turned on)

Measurement Modes Standard, Measure All Edges mode

Waveform Measurements

Voltage

Time

Mixed

Frequency Domain

Level Qualiﬁ cation

Peak to peak, minimum, maximum, average, RMS, amplitude, base, top, overshoot, preshoot, upper,

middle, lower

Rise time, fall time, period, frequency, positive width, negative width, duty cycle, burst width, Tmin, Tmax,

Tvolt, setup time (requires Option 002 or 004, standard on DSA models), hold time (requires

Option 002 or 004, standard on DSA models), channel-to-channel delta time, channel-to-channel phase

Area, slew rate, crossing point

FFT frequency, FFT magnitude, FFT delta frequency, FFT delta magnitude

Any channels that are not involved in a measurement can be used to level-qualify all timing measurements

Eye-diagram measurements Eye height, eye width, eye jitter, crossing percentage, Q factor, and duty-cycle distortion

Jitter analysis measurements

Clock

Data

Timing

Requires Option 002 (or E2681A) or 004 (or N5400A). Standard on DSA Series.

Statistics Displays the current, mean, minimum, maximum, range (max-min), standard deviation, number of

measurements value for the displayed automatic measurements

Histograms

Source

Orientation

Measurements

Waveform or measurement

Vertical (for timing and jitter measurements) or horizontal (noise and amplitude change) modes,

regions are deﬁ ned using waveform markers

Mean, standard deviation, mean ± 1, 2, and 3 sigma, median, mode, peak-to-peak, min, max, total

hits, peak (area of most hits), X scale hits, and X offset hits

Mask Testing Allows pass/fail testing to user-deﬁ ned or Agilent-supplied waveform templates. Automask lets you create

a mask template from a captured waveform and deﬁ ne a tolerance range in time/voltage or screen divi-

sions. Test modes (run until) include test forever, test to speciﬁ ed time or event limit,

and stop on failure. Executes “multipurpose” user setting on failure. “Unfold real time eye” feature

will allow individual bit errors to be observed by unfolding a real time eye when clock recovery is

on. Communications mask test kit option provides a set of ITU-T G.703, ANSI T1.102, and IEEE 802.3

industry-standard masks for compliance testing.

Waveform Math

Number of Functions

Hardware Accelerated Math

Operations

Four

Differential and Common Mode

Absolute value, add, average, Butterworth9, common mode, differentiate, divide, FFT magnitude, FFT

phase, FIR9, high pass ﬁ lter, integrate, invert, LFE9, low pass ﬁ lter (4th-order Bessel Thompson ﬁ lter),

magnify, max, min, multiply, RT Eye9, smoothing, SqrtSumOfSquare9, square, square root, subtract,

versus, and optional user deﬁ ned function (Option 010)

FFT

Frequency Range

Frequency Resolution

Window Modes

DC to 40 GHz (at 80 GSa/s) or 20 GHz (at 40 GSa/s)

Sample rate/memory depth = resolution

Hanning, ﬂ attop, rectangular

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