Agilent Technologies N1022A Manual de usuario Pagina 11

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High-Frequency Active Differential/Single-Ended Probe System
Agilent 1130A/31A/32A/34A InfiniiMax High-Performance Active Probe System
Specifications
Operating Characteristics
Probe bandwidth* 1134A: > 7 GHz
1132A: > 5 GHz
1131A: > 3.5 GHz
1130A: > 1.5 GHz
Rise and fall time (10% to 90%) 1134A: 60 psec
1132A: 86 psec
1131A: 100 psec
1130A: 233 psec
System bandwidth (–3 dB) 1134A with 54855A: 6 GHz
1132A with 54854A: 4 GHz
1131A with 54853A: 2.5 GHz
1131A with 54852A: 2 GHz
1130A with 54832B/D, 33A/D: 1 GHz
Input capacitance** Cm = 0.1 pF Cm is between tips.
Cg = 0.34 pF Cg is to ground for each tip.
Cdiff = 0.27pF Differential mode capacitance = Cm + Cg/2
Cse = 0.44 pF Singe-ended mode capacitance = Cm + Cg
Input resistance* Differential mode resistance = 50 k ±1%
Single-ended mode resistance = 25 k ±1%
Input dynamic range ±2.5 V
Input common mode range ±6.75 V dc to 100 Hz; ±1.25 V >100 Hz
Maximum signal slew rate 18 V/ns when probing a single-ended signal
30 V/ns when probing a differential signal
DC attenuation 10:1 ± 3% before calibration on oscilloscope
10:1 ± 1% after calibration on oscilloscope
Zero offset error referred < 30 mV before calibration on oscilloscope
to input < 5 mV after calibration on oscilloscope
Offset range* ± 12.0 V when probing single-ended
Offset accuracy < 3 % setting before calibration on oscilloscope
< 1 % setting after calibration on oscilloscope
Noise referred to input 3.0 mVrms
Propagation delay ~6 nsec (This delay can be deskewed relative to
other signals.)
Maximum input voltage* 30 Vpeak, CAT I
ESD tolerance > 8 kV from 100 pF, 300 HBM
* Denotes warranted specifications, all others are typical.
** Measured using the probe amplifier and solder-in differential probe head with full bandwidth resistors.
10
8
10
9
10
10
-12
-9
-6
-3
0
3
6
Frequency (Hz)
dB
10
8
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10
-60
-50
-40
-30
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-10
0
Frequency (Hz)
dB
Figure 3.4. Swept frequency response.
Figure 3.5. Common mode rejection
vs. frequency.
Example of characterized
performance plots: differential
solder-in probe head
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