Agilent Technologies N2781A Guía de usuario Pagina 95
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Digital Channels 6
Agilent InfiniiVision 2000 X-Series Oscilloscopes User's Guide 95
Increasing the ground inductance (L), increasing the current (di) or
decreasing the transition time (dt), will all result in increasing the voltage
(V). When this voltage exceeds the threshold voltage defined in the
oscilloscope, a false data measurement will occur.
Sharing one probe ground with many probes forces all the current that
flows into each probe to return through the same common ground
inductance of the probe whose ground return is used. The result is
increased current (di) in the above equation, and, depending on the
transition time (dt), the common mode voltage may increase to a level that
causes false data generation.
In addition to the common mode voltage,longer ground returns also
degrade the pulse fidelity of the probe system. Rise time is increased, and
ringing, due to the undamped LC circuit at the input of the probe, is also
increased. Because the digital channels display reconstructed waveforms,
they do not show ringing and perturbations. You will not find ground
problems through examination of the waveform display. In fact, it is likely
Figure 12 Common Mode Input Voltage Model
Z
in
Z
in
i
n
i
2
+iÊ
2
i
1
i
1
+iÊ
n
+iÊ
n
Z
in
Probe 1
Probe
Ground
Probe 2
Probe N
L (GND)
Vn (Common Mode)
- Agilent InfiniiVision 1
- 2000 X-Series 1
- Oscilloscopes 1
- In This Guide 5
- Contents 7
- Getting Started 19
- 1 Getting Started 20
- Getting Started 1 21
- Power-On the Oscilloscope 23
- Input a Waveform 25
- Use Auto Scale 26
- Compensate Passive Probes 27
- Perfectly compensated 28
- Over compensated 28
- Under compensated 28
- Quick Help 40
- Horizontal Controls 43
- 2 Horizontal Controls 44
- XY Time Mode 48
- To navigate time 53
- To navigate segments 53
- Vertical Controls 55
- 3 Vertical Controls 56
- To adjust the vertical scale 57
- To specify channel coupling 57
- To specify bandwidth limiting 58
- To invert a waveform 59
- To specify the channel units 60
- To specify the probe skew 61
- Math Waveforms 63
- 4 Math Waveforms 64
- Multiply 65
- Add or Subtract 66
- FFT Measurement 67
- FFT Measurement Hints 71
- FFT Units 72
- FFT DC Value 72
- FFT Aliasing 72
- FFT Spectral Leakage 74
- Reference Waveforms 75
- 5 Reference Waveforms 76
- Digital Channels 79
- 6 Digital Channels 80
- Pod Ground 81
- TTL +1.4 V 87
- CMOS +2.5 V 87
- ECL –1.3 V 87
- Input Impedance 92
- Probe Grounding 94
- Best Probing Practices 96
- Digital Channels 6 97
- Oscilloscopes Service Guide 97
- Display Settings 99
- 7 Display Settings 100
- To set or clear persistence 101
- To clear the display 102
- To select the grid type 102
- To adjust the grid intensity 103
- To freeze the display 103
- 8 Labels 106
- To define a new label 107
- Label List Management 109
- Triggers 111
- Adjusting the Trigger Level 112
- Forcing a Trigger 113
- Edge Trigger 113
- 9 Triggers 114
- Pattern Trigger 116
- Hex Bus Pattern Trigger 118
- Pulse Width Trigger 119
- Video Trigger 121
- Provide Correct Matching 123
- Alternate Triggering 125
- To trigger on all sync pulses 126
- Triggers 9 131
- Trigger Mode/Coupling 133
- 10 Trigger Mode/Coupling 134
- Oscilloscope triggers here 138
- Acquisition Control 141
- 11 Acquisition Control 142
- Sampling Theory 143
- Aliasing 143
- Oscilloscope Rise Time 145
- Memory Depth and Sample Rate 147
- Normal Acquisition Mode 148
- Peak Detect Acquisition Mode 148
- Averaging Acquisition Mode 151
- Acquiring to Segmented Memory 153
- Navigating Segments 155
- Progress indicator 155
- Sample rate 155
- Segmented Memory Re-Arm Time 156
- To make cursor measurements 158
- 12 Cursors 160
- Cursor Examples 161
- Cursors 12 163
- Measurements 167
- 13 Measurements 168
- Measurements Summary 169
- Snapshot All 171
- Peak-Peak 172
- Amplitude 172
- Overshoot 174
- Preshoot 175
- Time Measurements 179
- Frequency 180
- Burst Width 181
- Duty Cycle 181
- Rise Time 182
- Fall Time 182
- Source 1 Period 183
- Measurement Thresholds 184
- Absolute threshold hints 185
- Mask Testing 187
- 14 Mask Testing 188
- Mask Test Setup Options 189
- Mask Testing 14 191
- Mask Statistics 192
- Region 1 194
- Region 2 194
- Building a Mask File 196
- How is mask testing done? 198
- Waveform Generator 199
- 15 Waveform Generator 200
- To save setup files 207
- To save ALB data files 209
- Length Control 211
- Data File Format Save Times 212
- BIN, ALB fastest 212
- ASCII XY medium 212
- CSV slowest 212
- To save masks 213
- To navigate storage locations 214
- To enter file names 214
- To recall setup files 215
- To recall mask files 216
- Performing a Secure Erase 217
- Print (Screens) 219
- 17 Print (Screens) 220
- To specify the print options 221
- To specify the palette option 222
- Utility Settings 223
- 18 Utility Settings 224
- To establish a LAN connection 225
- File Explorer 227
- To set up the screen saver 230
- To set AutoScale preferences 231
- Performing Service Tasks 233
- To perform user calibration 234
- To perform hardware self test 236
- To clean the oscilloscope 237
- To contact Agilent 237
- To return the instrument 237
- Web Interface 241
- Accessing the Web Interface 242
- Browser Web Control 243
- Real Scope Remote Front Panel 244
- Simple Remote Front Panel 245
- 19 Web Interface 246
- Save/Recall 247
- Get Image 249
- Identification Function 250
- Instrument Utilities 251
- Setting a Password 252
- Configure 253
- Modify Configuration 253
- Reference 255
- 20 Reference 256
- Environmental Conditions 257
- Passive Probes 258
- Differential Probes 259
- Current Probes 259
- Accessories Available 260
- Licensed Options Available 261
- Other Options Available 262
- Upgrading to an MSO 262
- Binary Data in MATLAB 263
- Binary Header Format 264
- Reference 20 265
- Examples of Binary Files 266
- CSV and ASCII XY files 269
- Acknowledgements 271
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