Agilent Technologies B1542A Manual de usuario descargar pdf (Pagina 2)

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Feedback loop enables accurate

ID-VD and ID-VG measurement

This solution monitors the actual

MOSFET drain voltage and auto-

matically corrects the applied drain

voltage to insure that the actual

drain voltage (on the transistor side

of the load resistor) is correct for

each measurement point. This is

supported for both ID-VD and

ID-VG measurements.

Easy switching between dc and

pulsed measurements

A dc to pulsed IV switching option

is available to enable you to toggle

between dc measurements and pulsed

IV measurements without having

to change any cables. This makes it

easy to correlate dc measurements

with pulsed measurements, and it

also permits the automation of this

process.

Support 4155/4156 (B, C series)

The application supports not only the

B1500A but also Agilent 4155/4156

(B, C series), Agilent E5260A, Agilent

E5270B. If you already have these

instruments, you can utilize them for

the Pulsed IV solution with Desktop

EasyEXPERT software.

The Pulsed IV solution supports 4155/4156 (B, C series) through Desktop EasyEXPERT

Features

10 nanosecond gate pulse widths

This solution provides a 10 ns gate

pulse width with 2 ns rise and fall

times. It produces a clean rectangular

waveform with minimal overshoot

and undershoot.

1 µA current measurement

resolution

This solution gives 1 μA current

measurement resolution using a

10 ns pulse width, enabling more

precise characterization of high-k

and SOI devices.

Can reuse existing instruments to

lower costs

If you already have the Agilent pulse

generator and oscilloscope you can

use them with the pulsed IV solution.

This reduces the total cost of the

solution.

Easy setup using Agilent EasyEXPERT

software

Agilent EasyEXPERT software, which

is included on the B1500A and is also

available in a desktop version, makes

it easy for even neophyte users to

make pulsed IV measurements. After

selecting a pulsed IV application test,

an intuitive GUI-based test setup

window displays a complete schematic

of the test equipment, making it easy

to connect the components correctly.

Following a straightforward “ﬁ ll-in-

the-blanks” process, the user clicks

the “measure” button and begins

making pulsed IV measurements.

A graph and list of the data are

generated automatically, and the

user can export the data into a

variety of data-analysis tools such

as Microsoft Excel.

Applied 10 nsec gate pulse and measured

drain current

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