Agilent Technologies U7242A Manual de usuario

李凯 Agilent Technologies © Agilent Technologies, 2014 USB3.1最新技术 及测试方案

10 USB 2.0 Updates • Testing requirements evolve over time: • Details can be found at http://compliance.usb.org/index.html • Rise/Fall time measuremen

11 USB 3.1 简介 Here are some terms and their meanings used during this presentation • Gen1 – Superspeed USB 3.0 5 Gbps signaling rate • Gen2 – 10 Gbps

12 USB 3.1 gen1 和 gen2 的比较 Gen1 Gen2 Data rate 5Gb/s 10Gb/s Coding 8b/10b 128b/132b scrambler: G(X) = X23 + X21 + X16 + X8 + X5 + X2 + 1 SKP K28.1, K2

13 USB3.1的发送信号质量测试项目 3.0 3.1 TP x x CP0 TX 5G Eye Eye, Tj x CP9 TX 10G Eye Eye, Tj x x CP1 SSC Mod Rate, UI and Deviation ECN15, 18 x CP10 SSC Mod Rat

14 Agilent的USB 3.1 信号质量自动测试软件 © Agilent Technologies, 2014

15 Agilent USB 3.1 测试软件的测试项目 10G Test Requirements: • Like 5G testing LFPS, SSC and SSC requirements must be checked • Additional tests: • SCD1, SCD2

16 USB3.1 对测试点和眼图质量的要求 (TX Far End) © Agilent Technologies, 2014

17 Compliance Channels are used to test TX and RX for worst case channel conditions Standard connector: • Channel loss will dominate • 11” PCB trace

18 USB 3.1 中对于10G信号传输通道的要求  Full channel budget of 20 dB at 5Ghz  Symmetric loss for host and device  TX EQ settings informative only  Passing the

19 模拟传输通道对信号的影响 Embed Channel File “DEVICE_3MCABLE.s4p” Validation with InfiniiSim of DSA91304A © Agilent Technologies, 2014

2 演讲内容  Agilent 对最新数字总线标准的跟踪和支持  USB 协会的结构及认证实验室  USB 2.0/3.0 测试的最新变化  USB 3.1 简介  USB 3.1 的发送信号质量测试  USB 3.1 的接收容限测试  电缆、连接器测试  总结 © Agilent

20 Agilent的嵌入/去嵌入软件模拟传输通道或消除夹具影响 • Import channel s-parameters • Add channel loss – TopTX_Backpanel.s4p (simulate) • Remove fixture loss – U7242_short

21 USB 3.1 的接收均衡器 Ref CTLE + 1 tap DFE Eye at end of Channel CTLE @ -6dB + 1 tap DFE Embedded host channel © Agilent Technologies, 2014

22 TX compliance modes RX testing - loopback USB 3.1 的链路协商流程 © Agilent Technologies, 2014 USB 3.1 的链路 协商 流程

23 USB 3.1 信号质量测试中被测件码型的切换 PING.LFPS Toggles CP0/9 Dj CP1/10 Rj © Agilent Technologies, 2014

24 用Agilent示波器控制被测件的码型切换 •Connect Aux Out to DUT SSRX+ to toggle test modes •For DSOX use Cal Out Additional methods to toggle TX test modes: • Use d

25 扩频时钟（SSC）仍然是 USB 3.1测试中的一个挑战 • Spread spectrum clocking is the intentional down-spreading of the transmitter’s output data rate. -3700ppm -300

26 USB 3.1 的接收容限测试 • Low Frequency Periodic Signaling (LFPS) • Loopback • Jitter Tolerance • J-BERT SSC setup • N5990A Test Automation SW © Agilent T

27 USB 3.1的LFPS(Low Frequency Periodic Signaling) 码型： SCD1 / SCD2 – tRepeat Modulation • tRepeat is modulated to express 0 (short) and 1 (long) • SCD

28 USB 3.1的LFPS码型： LFPS Based PWM Signaling (LBPM) Encoding • Rate (speed and lane) announcement and negotiation • Repeater declaration • Power state

29 USB 3.1 接收测试时的环回设置 • Modification is within SKPOS only BERT ED needs to filter SKPOS on expected as well as received pattern and compare remaining

3 Agilent 对最新数字总线标准的跟踪和支持 • Our solutions are driven and supported by Agilent experts involved in international standards committees: • Joint Electron

30 前期验证阶段在模拟端进行的环回 （Analog Loopback） Early PHY only testing available by using analog loopback  analog loopback bypasses the clock compensation and b

31 USB 3.1 抖动容限的测试条件 – Base Spec Gen1 5G Gen2 10G TJ after RX EQ 450mUI 394mUI RJrms / RJpp ber=1E-12 12.1mUI / 177.9mUI 13.08mUI / 192.3mUI SJout of

32 USB 3.1 抖动容限的测试要求– Base Spec • Center Data Rate with SSC: 9.975Gb/s • SSC: Center Spread 33kHz with 0.25% • Voltage Swing @ TP1: 800mV • Pre-shoot

33 N4903B误码仪进行接收容限测试时的SSC设置 1. Upper data rate 2. Center data rate 3. Lower data rate 4. Deviation 5. Modulation Frequency 6. Arbitrary modulation pro

34 N5990A USB 3.0 接收容限自动测试软件 LFPS and HighSpeed tests with channel add setup Configure device as • host or device • SuperSpeed or HighSpeed • Standar

35 USB 3.1 中的接收一致性测试和抖动容限测试 • Automated instrument control for: • Setup calibration • Compliance test • Characterization test • Support for debugging

36 USB 3.1 设计和测试中的主要挑战 •Transmitter SSC quality •SSC ECNs •Interference issues •Loopback issues •Dut needs custom sequence •DUT drops out easily •Ca

37 Time & Frequency Frequency Time & Frequency Time & Frequency Time & Frequency Agilent的ENA网络分析仪支持的电缆、连接器测试标准 Certified Method of Imp

38 Test Centers Support ENA Option TDR ENA在全球认证测试实验室的使用情况 Certified Test Centers using ENA Option TDR ENA Option TDR is used world wide by certified

39 Receiver Test Transmitter Test Interconnect Test DSOX92504A Infiniium real time scope SW HW Fixture DUT N4903B J-BERT High-Perf Se

4 Jim Choate USB-IF Compliance Committee USB 3.0 Electrical Test Spec WG Rick Eads PCI-Sig Board Member Brian Fetz DisplayPort Phy CTS Editor VESA Bo

40 USB-IF compliance tests and requirements have changed over time. Be sure to check for updates and ECNs at http://www.usb.org/developers/docs/ USB

41 更多信息和参考资料 Agilent Oscilloscope information (TX testing solutions) www.agilent.com/find/scopes Agilent Oscilloscope application software http://www.

5 USB接口设备的发展 • USB is the most successful interface in the history of PC • Device charging over USB has become a major consumer feature • USB instal

6 USB协会（Implementers Forum）的组织结构 USBIF Board Members Intel, NEC, HP, Microsoft, ST-Ericsson, LSI Agilent Active Membership Marketing WG Device WG Ca

7 Agilent 对全球USB认证测试实验室的支持 XXCAL Japan SGS Taiwan Hong Kong STC NTS USA NSTL USA MCCI USA Testronics Belgium Allion USA

8 • HSIC – a low power USB chip to chip solution designed for mobile applications • SSIC – USB 3.0 performance extension for chip to chip solution des

9 USB 的电源供电（Power Delivery）标准 • Increases negotiated power up to 100W • Sink/source can be swapped, power direction no longer fixed • Communication of