Agilent Technologies HP 3325B Especificaciones Pagina 202
- Pagina / 239
- Tabla de contenidos
- SOLUCIÓN DE PROBLEMAS
- MARCADORES
- Printed in USA July 2004 1
- HP 1660C/CS/CP-Series 2
- Logic Analyzers 2
- In This Book 5
- Table of Contents 6
- General Information 12
- Specifications (oscilloscope) 15
- Range (1:1 Probe) 21
- Equipment Required 25
- Preparing for Use 28
- Preparing For Use 29
- To apply power 30
- To operate the user interface 30
- To set the line voltage 30
- To degauss the display 31
- To clean the logic analyzer 31
- To test the logic analyzer 31
- To perform the self-tests 34
- Select All System Tests 35
- Select the Front Panel Test 35
- Select the Display Test 35
- Test the TTL threshold 42
- Test the ECL threshold 44
- Test the − User threshold 45
- Test the + User threshold 46
- Test the 0 V User threshold 47
- Test the next pod 48
- Test the next channels 54
- (logic analyzer) 55
- Verify the test signal 60
- 3.5/0.0 ns 62
- 0.0/3.5 ns 62
- 1.5/2.0 ns 62
- 4.5/0.0 ns 75
- 0.0/4.5 ns 75
- 2.0/2.5 ns 75
- K↑ + L↑ + P↑ 76
- K↓ + L↓ + P↓ 78
- −100 ps 87
- Set up the Waveform menu 94
- Verify the DC CAL OUTPUT port 98
- Verify the AC CAL OUTPUT port 99
- Set up the equipment 100
- Set up the logic analyzer 101
- Connect the logic analyzer 102
- Acquire the data 103
- Acquire the zero input data 111
- Acquire the DC input data 112
- Set up the Trigger menu 115
- Set up the Markers menu 120
- Testing Performance 127
- Ω (49.5 to 50.5 Ω) 132
- Test Settings Results 135
- Self-Tests 135
- Pass/Fail ________ 135
- Calibrating and Adjusting 136
- To calibrate the oscilloscope 138
- Self Cal menu calibrations 140
- Model/Part 141
- Alignment Tool 1 8710-1300 141
- To adjust the CRT intensity 143
- Troubleshooting 146
- To use the flowcharts 148
- To check the power-up tests 162
- To run the self-tests 163
- Data Input Inspection 167
- To test the keyboard signals 172
- To perform the BNC test 176
- Set up the Format menu 178
- Set up the Listing menu 179
- To test the auxiliary power 183
- Replacing Assemblies 184
- Exploded View 186
- To remove and replace the fan 199
- To return assemblies 201
- Replaceable Parts 202
- Replaceable Parts List 204
- Theory of Operation 210
- Block-Level Theory 212
- The Logic Acquisition Board 216
- The Oscilloscope Board 219
- The Pattern Generator Board 222
- Self-Tests Description 224
- System Tests (System PV) 225
- Status Reporting Message 227
- Status Bits 228
- Analyzer Tests (Analy PV) 229
- Oscilloscope tests (Scope PV) 231
- Test 1 Fail row Failed test 232
- Row/Col Fail row Failed RAM 233
- HP-IB Interface Connector 236
- RS-232-C 237
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