
Parallel Carrier Aggregation Test
(Inter-band)
Advantages:
No increase in test time
for every additional Tx/Rx path
tested in the UE
Disadvantages:
More complex to implement
Requires a complex chipset
test mode to activate all paths
in the target UE
Required test equipment must be
duplicated for each additional
Tx/Rx path tested in parallel in the
UE
March 27, 2014
Confidentiality Label
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