Agilent Technologies E6392B Manual de usuario descargar pdf (Pagina 15)

84000 RFIC Series Test System

• models available with 2 to 12 RF

ports, include multiple DC

resources standard

• options for analog mixed signal

stimuli and measurement

• rock solid correlation to laboratory

grade RF bench tests

The 84000 RFIC Series is a complete,

flexible and scalable system for high

volume wafer and package testing of

RF Integrated Circuit (RFIC) devices.

93000 SOC Series Test System

• complete testing for System-on-a-

Chips (SOCs)

• supports cellular/PCS, Bluetooth,

and WLAN SOC testing

• offers a robust set of capabilities:

~

up to 1024 digital pin with

data rates up to 2.5 Gbps

~

wide range of analog modules,

~

RF measurement suite provides

up to 12 RF ports with 8 GHz

modulated stimulus and

measurement capability

~

at-speed scan and embedded

memory test capabilities

For more information,

please visit our Web site at:

www.agilent.com/go/

semiconductortest

ESG Vector Signal Generators

• supports wireless communications

standards including 3GPP

W-CDMA, cdma2000, cdmaOne,

EDGE, GSM, NADC, PDC, DECT,

TETRA, Bluetooth, 1xEV-DO,

802.11a, and 802.11b

• expandable architecture with

broad frequency coverage -

(250 kHz to 1, 2, 3, 4 and 6 GHz)

• 160 MHz of RF bandwidth with

external I/Q inputs

• 32 Msamples (160 megabytes)

waveform playback memory

• differential I/Q outputs

• internal I/Q calibration

The ESG vector signal generator

provides precise frequency and level

control, and versatile modulation

capabilities at an affordable price.

They are ideally suited to meet the

demanding requirements of today's

receiver test, component test, and

local oscillator applications. Using the

high-speed processor, 32 Msamples

waveform playback memory and

6 gigabytes waveform storage you

can build waveforms fast and

switch between them in playback

and storage memory.

For more information,

please visit our Web site at:

www.agilent.com/find/esg

8960 Series 10 Wireless

Communications Test Set

• test speed helps improve mobile

test throughput

• accuracy and repeatability give

confidence in mobile quality

• multi-format capability allows for

flexible manufacturing

• reduced instruction set

programming simplifies test code

• flexible architecture designed to

grow with 3G technologies

Developed for high-volume, automated

mobile phone manufacturing test,

the proven 8960 Series 10 test set

helps manufacturers lower test costs

and increase production output. The

8960 can be configured for GSM, GPRS,

TIA/EIA-136, AMPS, cdma2000, IS-95

and W-CDMA IS-95. Multi-format

test capability allows manufacturers

to test multi-format devices with a

single test set, change production from

one format to another, or manufacture

mobile devices with different formats

on the same line.

For more information,

please visit our Web site at:

www.agilent.com/find/8960support

15

Semiconductor Test Signal Generators Wireless Test Sets

Manufacturing

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