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Option 200 enhanced jitter analysis software

Measurements

Total Jitter (TJ), Random Jitter (RJ), Deterministic Jitter (DJ), Periodic

Jitter (PJ), Data Dependent Jitter (DDJ), Duty Cycle Distortion (DCD), In-

tersymbol Interference (ISI), Sub-Rate Jitter (SRJ), Asynchronous periodic

jitter frequencies, Subrate jitter components.

FlexDCA adds the following measurements:

Data Dependent Pulse Width Shrinkage (DDPWS), Uncorrelated Jitter

(UJ), J2, J9

Data displays

TJ histogram, RJ/PJ histogram, DDJ histogram, Composite histogram,

DDJ versus Bit position, Bathtub curve (log or Q scale)

Option 201 advanced waveform analysis

Measurements

Deep memory pattern waveform, user-defined measurements through

MATLAB interface

Data displays

Equalized waveform

Option 202 enhanced impedance and S-parameters

Option 300 amplitude analysis/RIN/Q-factor

(requires Option 200)

Measurements

Total Interference (TI), Deterministic Interference (Dual-Dirac model, DI),

Random Noise (RN), Periodic Interference (PI), and Inter-symbol Interfer-

ence (ISI), RIN (dBm or dB/Hz), Q-factor

Data displays

TI histogram, RN/PI histogram, ISI histogram

Option 400 PLL and jitter spectrum measurement

software

Jitter spectrum/phase noise measurements

Integrated Jitter: Total Jitter (TJ), Random Jitter (RJ), Deterministic Jitter

(DJ);DJAmplitude/Frequency,JitterSpectrumGraph,JitterversusTime

Graph, Frequency versus Time Graph, Jitter Histogram, Post Processed

Jitter Measurements, Phase Noise Graph dBc/Hz versus frequency

The 86100D DCA-X features two user interfaces for optimum ease-of-use.

It includes the classic DCA interface for complete backwards compatibility

with earlier DCA mainframes. It also includes the new FlexDCA interface

that provides new measurements and powerful analysis capability in a

fully customizable application.

The following measurements are available from the tool bar, as well as

the pull down menus. The available measurements depend on the DCA-X

operating mode.

Oscilloscope mode

Time

Rise Time, Fall Time, Jitter RMS, Jitter p-p, Period, Frequency, + Pulse

Width, – Pulse Width, Duty Cycle, Delta Time, [Tmax, Tmin, Tedge—re-

mote commands only]

Amplitude

Overshoot, Average Power, V amptd, V p-p, V rms, V top, V base, V max, V

min, V avg, OMA (Optical Modulation Amplitude)

Eye/Mask mode

NRZ eye measurements

Extinction ratio, Jitter RMS, Jitter p-p, Average Power, Crossing Percent-

age, Rise Time, Fall Time, One Level, Zero Level, Eye Height, Eye Width,

Signal to Noise, Duty Cycle Distortion, Bit Rate, Eye

Amplitude

RZ eye measurements

Extinction Ratio, Jitter RMS, Jitter p-p, Average Power, Rise Time, Fall

Time, One Level, Zero Level, Eye Height, Eye Amplitude, Opening Factor,

Eye Width, Pulse Width, Signal to Noise, Duty Cycle, Bit Rate, Contrast

Ratio

Mask test

Open Mask, Start Mask Test, Exit Mask Test, Filter, Mask Test Margins,

Mask Margin to a Hit Ratio, Mask Test Scaling, Create NRZ Mask

Advanced measurement options

The 86100D’s software options allow advanced analysis.

Options 200, 201, and 300 require mainframe Option ETR.

Option 202 does not require mainframe Option ETR.

Option 401 does not require Options ETR and 200 unless a DDPWS

measurement is required.

Agilent 86100D Wide-Bandwidth Oscilloscope

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