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Performance Tests Test Records
220 Agilent 81600B Tunable Laser Source Family, Fourth Edition
Agilent 81600B #142 Performance Test Page 4 of 13
Model Agilent 81600B #142 Tunable Laser Report No. ________ Date_______
Relative Wavelength Accuracy
Summary of all Repetitions
Largest Maximum Deviation ______nm
Smallest Minimum Deviation _______nm
Relative Wavelength Accuracy Result (= Largest Maximum Deviation − Smallest Minimum Deviation)
Relative Wavelength Accuracy
________nm
Upper Test Limit 0.010 nm
Measurement Uncertainty: ±0.2 pm
Absolute Wavelength Accuracy Result Largest Value of Deviation (= largest value of either Largest Maximum
Deviation or Smallest Minimum Deviation)
Absolute Wavelength Accuracy ______nm
Upper Test Limit 0.01 nm
Measurement Uncertainty: ±0.6 pm
- Agilent 81600B 1
- User’s Guide 1
- In This Guide 4
- Table of Contents 5
- Specifications 33 6
- Performance Tests 71 7
- Index 269 8
- List of Figures 9
- Tunable Laser Source Family 11
- General Safety Considerations 12
- Line Power Requirements 13
- Operating Environment 13
- Initial Inspection 13
- Input/Output Signals 14
- Storage and Shipment 14
- Agilent 81600B family modules 15
- Laser Safety Labels 16
- What is a Tunable Laser? 17
- Front Panels 18
- Typical Use Models 19
- Optical Output 21
- Straight Contact 22
- Connector Symbol 22
- Angled Contact 22
- Signal Input and Output 23
- Accessories 25
- Laser Source Modules and 26
- Option 81600B-072 is highly 27
- Module Options 28
- User’s Guides 29
- Accessories Module Options 30
- Specifications 33
- Definition of Terms 35
- General Definitions 36
- (continuous sweep mode) 38
- Effective linewidth 38
- Linewidth 40
- Maximum output power 40
- Mode-hop free tunability 41
- Output isolation 41
- Polarization extinction ratio 42
- Power linearity 43
- Power repeatability 43
- Power stability 44
- Return loss 46
- Side-mode suppression ratio 46
- (SSE) ratio 46
- Wavelength range 48
- Wavelength resolution 49
- Wavelength stability 50
- Laser Source Module 51
- At constant temperature ±1 K 53
- Conditions 66
- Operating Modes: 68
- Coherence Control: 68
- Output Isolation (typ.): 69
- Return Loss (typ.): 69
- Specifications Conditions 70
- Performance Tests 71
- Required Test Equipment 73
- Test Failure 74
- Instrument Specification 74
- Performance Test Instructions 75
- General test Setup 75
- Environment 75
- Wavelength Tests 76
- Wavelength Accuracy 77
- Mode-Hop Free Tuning 81
- Power Tests 88
- Power Stability 107
- Measurement Principle 112
- ≅1407 nm 117
- Test Procedure 123
- Performance Tests Power Tests 130
- Optional Performance Tests 131
- Dynamic Wavelength Accuracy 135
- Analysis 142
- Normalized Sweep Acceleration 145
- Test Records 146
- Test Record 148
- Test Equipment Used 149
- ________nm 151
- Mode Hop Free Tuning 152
- Wavelength Repeatability 153
- Maximum Power Test 154
- Power Flatness 158
- Wavelength Deviation = Wave 179
- Upper Power Levels 212
- Power Linearity 237
- Safety Precautions 245
- Why is it important to clean 246
- What materials do I need for 247
- Cotton swabs 248
- Soft tissues 248
- Pipe cleaner 249
- Compressed air 249
- Additional Cleaning Equipment 250
- Premoistened cleaning wipes 251
- Polymer film 251
- Infrared Sensor Card 251
- Preserving Connectors 252
- Cleaning Instrument Housings 253
- General Cleaning Procedure 254
- Preferred Procedure 255
- Alternative Procedure 255
- Procedure for Stubborn Dirt 255
- An Alternative Procedure 255
- CAUTIONWARNING 261
- How to clean bare fiber ends 265
- Alternative Procedure A 267
- Alternative Procedure B 267
- Other Cleaning Hints 268
- Agilent Technologies 272
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