Agilent Technologies 54657A Guía de usuario descargar pdf (Pagina 45)

Unattended Waveform Monitoring

The Measurement/Storage Module simplifies circuit debugging by comparing

an active channel (not functions) trace on the display to one of two test

templates.

When a failure is detected, the oscilloscope can be instructed to take one of

several actions.

•

The test can be set to stop after the first failure, or to continue regardless

of the number of failures found.

•

The failed trace(s) can be stamped with the date and time of the failure,

and stored in trace memory or output to a hardcopy device. When trace

memory is selected, the user has the option of saving all failures, or saving

only the last failure that occurred.

•

The test can continue with statistics on the number of failures (reported

as a percentage of the number of tests performed) being displayed.

The mask templates can be defined one of two ways. Once a mask is created,

it is stored in nonvolatile RAM.

•

Automask Quickly generates a mask template from currently displayed

data. You are allowed to select the mask tolerance prior to creating the

template.

•

Editor Used to adjust the tolerances of a previously created template in

areas of specific interest, or to create a complete new mask. Mask editor

allows pixel-by-pixel editing, and smoothing of the mask by using a

running average of three pixels.

Failures can be specified one of two ways.

•

Inside Test fails if signal falls inside the region defined by the maximum

and minimum limit lines of the mask template.

•

Outside Test fails if signal falls outside the region defined by the

maximum and minimum limit lines of the mask template.

Operating the Measurement/Storage Module

Unattended Waveform Monitoring

2–29

1 2 ... 40 41 42 43 44 45 46 47 48 49 50 ... 88 89

Sin comentarios

Agilent Technologies 54657A Guía de usuario Pagina 45