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1-2
Making Measurements
Using This Chapter
Using This Chapter
This chapter contains the following example procedures for making measurements. Mixer
and time domain measurements are covered in Chapter 2 , "Making Mixer Measurements
(Option 089 Only)" and Chapter 3 , “Making Time Domain Measurements.” This chapter
also describes how to use most display, marker, and sequencing functions.
Making a Basic Measurement on page 1-4
Measuring Magnitude and Insertion Phase Response on page 1-7
Measuring Electrical Length and Phase Distortion on page 1-43
Electrical Length
Phase Distortion (deviation from linear phase, group delay)
Characterizing a Duplexer (ES Analyzers Only) on page 1-50
Measuring Amplifiers on page 1-53
Measuring Harmonics
Measuring Gain Compression
Measuring Gain Compression and Reverse Isolation Simultaneously
(ES Analyzers Only)
Making High Power Measurements (ES Analyzers Only)
Using the Swept List Mode to Test a Device on page 1-68
Using Limit Lines to Test a Device on page 1-73
Using Test Sequencing to Test a Device on page 1-113
The following chapters describe how to use more instrument functions (as indicated by
their chapter titles):
Chapter 4 , "Printing, Plotting, and Saving Measurement Results"
Chapter 5 , "Optimizing Measurement Results"
Chapter 6 , "Calibrating for Increased Measurement Accuracy"
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