16
Graphical view of limits and specifications
As with other measurements, the actual limits depend on many factors, namely,
class, type, system and power level. Figure 13 gives example limits for EGSM900
MS and Normal BTS at high power.
Practical measurements
Spectrum due to modulation and wideband noise measurements are both difficult
and time consuming if made precisely as the ETSI and ANSI type approval
specifications require. It is normal to perform some subset of the defined
measurement set in most applications for time and/or cost reasons.
At wide offsets such as 600 kHz and above, these measurements require high
dynamic range—this has historically been expensive. They also require a large
amount of processing power if they are to be done rapidly. In some applications
the complete suite of spectrum due to modulation and wideband noise measure-
ments are only performed on a sample basis.
Historically, standard spectrum analyzers have been used, and when provided with
an appropriate gate signal this method works well. However, this time-consuming
technique requires a series of separate measurements and frequent re-tuning. The
VSA-series transmitter tester provides two techniques for overcoming this prob-
lem.
First, with a wide bandwidth sampler, it is possible to perform many of the close-in
measurements up to 600 kHz, using DSP techniques—essentially FFTs. This
means that several measurements can be performed on the same sample set,
which results in a significant speed improvement.
A further speed improvement can be achieved by measuring over a greater portion
of the burst. The standards define that these measurements should be performed
over the 50%–90% portion of the burst. However, for practical speed improvement,
it is quite reasonable to measure over 10%–90% portion of the burst.
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