Agilent Technologies Switch/Measure Manual de usuario descargar pdf (Pagina 22)

Practical measurements

To date, no analyzer has sufficient dynamic range to measure Rx band spurious

to the ETSI and ANSI specifications directly. Usually a Rx bandpass filter is used

in front of the analyzer input to attenuate the Tx band signal.

As with all spurious measurements it is possible to speed up the process for

BTS manufacturing by simply checking selected or “at risk” parts of the band.

In other words, through design analysis and experimentation it is possible to

determine at which frequencies the transmitter is most likely to fail and then

test only at these frequencies to minimize test time.

When to use the measurement

The application of Tx band spurious measurements should be considered

alongside the application of spectrum due to modulation and wideband noise

measurements because there is some redundancy here. It is reasonable, in

manufacturing for example, to perform the spectrum due to modulation and

wideband noise measurement only up to and including the 1800 kHz offset (±)

and then apply the Tx band spurious measurement, if needed, to check the rest

of the the Tx band.

As with spectrum due to modulation and wideband noise, Tx and Rx band

spurious measurements need not be comprehensively performed outside of

R&D, verification and type approval. A limited subset of these measurements

can be derived and used in manufacturing and the field service for cost and

time reasons.

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Agilent Technologies Switch/Measure Manual de usuario Pagina 22