
Agilent B2900 SCPI Command Reference, Edition 2 2- 45
Subsystem Command Summary
Reading Source/Measure Data
:CALC[c]:DATA? [offset[,size]]
:CALC[c]:DATA? returns limit test data.
offset=CURRent|STARt|0 to maximum
size=1 to maximum
:CALC[c]:DATA:LAT? returns the last
limit test data.
Elements of the returned data are
specified by the :FORM:ELEM:CALC
command. The limit test data can be
expressed by the following formula.
limit test data = input data - null offset
STAR and
all
data
:CALC[c]:DATA:LAT?
:CALC[c]:DIG:BIT pin
:CALC[c]:DIG:BIT?
Assigns the GPIO pins used for the result
output. The output is the pass/fail bit
pattern.
pin=EXTn|NONE. n=1 to 14.
NONE
:CALC[c]:DIG:BUSY pin
:CALC[c]:DIG:BUSY?
Assigns the GPIO pin for the BUSY
(busy) line for the composite limit test.
pin=EXTn|NONE. n=1 to 14.
NONE
:CALC[c]:DIG:EOT pin
:CALC[c]:DIG:EOT?
Assigns the GPIO pin for the EOT (end of
test) line for the composite limit test.
pin=EXTn|NONE. n=1 to 14.
NONE
:CALC[c]:DIG:SOT pin
:CALC[c]:DIG:SOT?
Assigns the GPIO pin for the SOT (start
of test) line for the composite limit test.
pin=EXTn|NONE. n=1 to 14.
NONE
:CALC[c]:FEED type
:CALC[c]:FEED?
Specifies the input data value used for
calculating the limit test data. The limit
test is a pass/fail judgement performed
during a composite limit test. The limit
test is performed at the “Pass?” step in
Figures
2-10 and 2-11.
type=MATH|RESistance|CURRent|VOL
Tage
VOLT
Command Summary Reset setting
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