Agilent Technologies 8510C Manual de servicio descargar pdf (Pagina 111)

8510XF Network Analyzer Systems 3-41

Operation

Service

Peek/Poke Functions The last three softkeys make it possible to read from, or write to, a location

within the memory of the millimeter-wave controller.

• {PEEK/POKE LOCATION} speciﬁes the memory location to be read from, or

written to.

• {PEEK TEST SET} reads data from the memory location already speciﬁed.

• {POKE TEST SET} writes data to the memory location already speciﬁed.

Leveling Settings [SYSTEM] {MORE} {SERVICE FUNCTIONS} {XF TESTSET SERVICE} {LEVELING SETTINGS}

calls up the submenu shown on the right of Figure 3-22 on the previous

page.

These functions relate to detector gain calibration (see “Reset Detector Gain

Calibration” on page 3-34). They are intended to be used only by Agilent

service engineers.

{SET GAIN (IF LEVEL)} makes it possible to specify the gain (in dB) of the

programmable gain portion of the level control circuit. (Perform a detector

gain calibration before selecting this function.)

{SET ATTN} makes it possible to specify the attenuator setting for the

programmable gain portion of the level control circuit. Possible values are 0

to 133, with each increment representing 0.5 dB of attenuation.

{SET DAC} makes it possible to specify a multiplier value for the DAC in the

programmable gain portion of the level control circuit. Possible values are

0 to 255.

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Agilent Technologies 8510C Manual de servicio Pagina 111