Agilent Technologies 8510C Manual de servicio Pagina 145
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8510XF Network Analyzer Systems 5-9
System Maintenance
Theory of Operation
Theory of Operation
Signal Separation The illustration below shows how directional couplers are used to separate
incident RF signals (“a1” and “a2”) from reflected or transmitted RF signals
(“b1” & “b2”). The separated RF signals are mixed with a common LO
signal, in order to generate the four IF inputs to the network analyzer.
This process is typical of 8510C mixer-based test sets generally; it is not
unique to the 8510XF.
Figure 5-2 Signal Separation and Mixing
- Operating and Service 1
- Restricted Rights Legend 2
- Warranty 4
- Contacting Agilent 5
- Instrument Markings 7
- Safety Requirements 7
- Safety Earth 7
- Typeface Conventions 9
- Compliance with Standards 10
- Contents 13
- 1 Introduction 17
- Finding System Information 18
- Introduction 19
- Two Versions of the 21
- System Description 22
- Wafer Probe 23
- (45 MHz to 2 GHz) 24
- (RF Passthrough) 24
- Option 010 25
- (Time Domain) 25
- Option 230 25
- (Line Voltage) 25
- Upgrade Paths 26
- Upgrade Kits for the 27
- 85106C/D 27
- (With Option 002) 28
- 2 Installation 29
- Site Preparation 30
- Environmental 31
- Requirements 31
- Weight and dimensions 32
- Agilent Technologies 33
- Customer Engineering 33
- In Case of Problems 33
- Installation 34
- Receiving the System 34
- Precautions 37
- Electrostatic 38
- Discharge 38
- Test Port Inputs 38
- Cleaning 38
- Unpacking the System 39
- Safety Glasses 40
- Foam cover 41
- Figure 2-5 Removing the Bolts 42
- Unload the system 43
- Basic System Configurations 45
- Basic System Configurations 46
- Installing the Work 48
- Test Heads 54
- Systems With 56
- Instruments Without 58
- Cable List 60
- Other Connections 65
- Turning On the System 66
- System Operational Test 67
- Test Procedure Setup 68
- Operating Notes 70
- • Start: −35 dBm 70
- • Stop: −15 dBm 70
- 3 Operation 71
- 8510XF Operating System 72
- Menu Conventions 73
- Used in this Chapter 73
- • {TRIM SWEEP} is deleted 74
- • {RAMP} is deleted 74
- Measurement Calibration 76
- • SOLT (Short-Open-Load-Thru) 77
- • TRL (Thru-Reflect-Line) 77
- • TRM (Thru-Reflect-Match) 77
- On-wafer calibration 78
- Calibration Procedure 79
- Connect and Measure 80
- Non-Banded 82
- Calibration Types 83
- Select ONE of the 84
- Response Standards 84
- Standard Types 90
- • S11 1-Port calibrations 91
- • S22 1-Port calibrations 91
- • Full 2-Port calibrations 91
- One-Path 94
- Transmission 94
- One-Path Isolation 95
- Standard 95
- Full 2-Port 96
- Full 2-Port Isolation 97
- Port Power 98
- RF Power 100
- Unleveled/Overmod 101
- Detection 101
- Explanation 101
- Reset Detector Gain 102
- Calibration 102
- Operation 103
- LO Power 106
- IF Frequency 112
- Broadband SOLT 114
- Broadband TRM 115
- Standards 115
- Types of Probe 117
- Stations 117
- 4 Performance Verification 119
- Verification Overview 120
- • Frequency of use 120
- • Amount of cable movement 120
- Calibration and 121
- Frequency Ranges 121
- Frequency ranges 122
- Verification Setup 123
- Software 124
- Configuration 124
- Performance Verification 125
- Verification Setup 125
- Printer Selection 126
- Verification Procedures 127
- Verification Procedures 128
- Table 4-6) 129
- 12. Select 129
- High Band Verification 130
- (> 50 GHz) 130
- CW Frequency Accuracy Test 132
- • 10 dB pad 132
- CW Frequency Accuracy Test 133
- Performance Test 134
- Calibration Storage Locations 135
- Calibration Techniques: 135
- Clarifying Connector Sex: 135
- Offset Shorts: 135
- 5 System Maintenance 137
- Electrostatic Discharge 138
- 1.0 mm Connector Care 139
- Mating plane surfaces 140
- Connector wear 140
- Visual inspection 140
- Cleaning connectors 141
- Connector care supplies 141
- Purpose of the 142
- The Calibration 142
- System Maintenance 143
- Detector Gain Calibration 143
- Conversion Loss Calibration 144
- Theory of Operation 145
- 50 to 75 GHz Band or 149
- 50 to 85 GHz Band 149
- RF Leveling vs 150
- IF Leveling 150
- Advantages of IF leveling 151
- Programmable gain 151
- Detector 151
- Multiplying DAC 152
- Blanking circuit 153
- Spurious error messages 153
- Detector gain calibration 154
- Frequency-related variations 155
- Level control performance 155
- System Block Diagrams 157
- HP E7350 159
- Rev. 5 2/17/98 159
- Rev. 7 3/5/98 161
- Option 006 163
- Option 005 163
- HP E7340 167
- Rev. 6 2/17/98 167
- Hardware 173
- Configuration Check 173
- Firmware 174
- Define the problem 175
- Record any error messages 175
- 8510C diagnostics 175
- Check unratioed power levels 175
- Troubleshooting 176
- 6 Replaceable Parts 177
- Replaceable Parts 178
- Categorization of 179
- Components 179
- 110 GHz Systems 180
- Millimeter-Wave 182
- Subsystem 182
- 85 GHz Systems 183
- Millimeter-Wave Controller 186
- 7 Menus & Commands 189
- Menu Maps 190
- Rev. 1 3/10/98 198
- Modify Cal Kit 198
- New GPIB Commands 211
- Menus & Commands 212
- Unsupported GPIB Commands 215
- New Messages 217
- Warnings messages 218
- Numerics 219
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