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Chapter 5: Troubleshooting

Acquisition Board Trouble Isolation - Scope Self Tests

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Acquisition Memory Test Group

• MBIST - This test checks the embedded memory in each memory controller ASIC for errors. If the

errors can be corrected using the redundancy present in the IC, the software will perform the necessary

correction.

• Register Test - This test verifies that all of the memory controller ASIC registers can be correctly

written to and read from. If the test reads any registers whose values are not equal to what they were

written to, it will report a failure for the Hedwig with the associated error.

Misc. Scope Test Group

• Temp Sensor Test - This test verifies that all of the temperature sensors in the oscilloscope are reading

values within the expected range. Temperature sensors exist for each of the memory controller ICs,

each of the ADC ICs, and each of the front end ICs. If any temperature sensor measure a temperature

that is outside of the expected operating range, a failure will be reported for the IC associated with

that temperature sensor.

• Acq Flash RAM Test - This test checks the flash RAM located on the acquisition board for errors. If

any errors are found, a failure is reported for the particular flash RAM that was found to be bad.

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Agilent Technologies Ininiium 9000 Especificaciones Pagina 106